In this webinar, Dr. Denis Vasyukov will describe Scanning Microwave Microscopy (SMM), a scanning probe technique that uses microwaves to probe up to a few hundred nanometers below the surface. The information gathered from the SMM measurement can be used to reconstruct important electrical parameters of the material, such as the dielectric constant, conductivity and resistance, and carrier density. This webinar was postponed from June to July in order to include new and exciting data.