DESKTOP SEM
กล้องจุลทรรศน์อิเล็กตรอนแบบตั้งโต๊ะ
The Phenom Desktop SEM delivers high-resolution imaging and elemental analysis (with an integrated EDS detector) in a compact, easy-to-use design. Perfect for materials science, quality control, failure analysis, and academic research, this benchtop SEM combines speed, precision, and simplicity – enabling even first-time users to achieve professional-grade results in minutes.
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Our Electron Microscopes
Phenom Pharos FEG-SEM
This high-performance desktop SEM offers integrated EDS for elemental analysis. It delivers <6nm (SE) and <8nm (BSE) resolution and magnifies up to 350,000x. An optional SE detector is also available.
Phenom XL G2
Designed for large samples (100×100 mm) and automated workflows, this system offers <10 nm resolution, up to 200,000x magnification, and a 4.8-20 kV acceleration voltage. Optional integrated EDS and BSE detectors are available.
Phenom ProX G6
This high-performance desktop SEM offers integrated EDS for elemental analysis, achieving <6nm (SE) and <8nm (BSE) resolution and up to 350,000x magnification. An optional SE detector is available.
Phenom Pro G6
This high-performance desktop SEM offers <6nm (SE) and <8nm (BSE) resolution, up to 350,000x magnification, and an optional SE detector.
Phenom Pure G6
Entry-level desktop SEM with <15nm resolution, up to 175,000x magnification, and a long-life CeB6 source.
Phenom ParticleX SEM
ParticleX automates SEM-EDS for unbiased quality control in Steel, AM, GSR, TC, and battery industries, ensuring standards compliance.
