Transmission electron microscopy (TEM)

Transmission electron microscopy (TEM) is a high-resolution imaging technique in which a beam of electrons passes through a thin sample to produce an image. The electron beam is impacted by the sample’s thickness/density, composition, and, in some cases, crystallinity. The electrons that are transmitted through the specimen subsequently provide contrast in the resulting image, revealing high-resolution compositional information.

TEM instruments for Material Science

Cryo EM sample preparation using the Aquilos 2 Cryo FIB - Extend cryo EM sample prep run time with enhanced automation for cryo electron tomography and microED.

Talos (S)TEM

Your daily partner for fast, high-quality imaging, EDS mapping, and sample screening

  • - High tension: 80–200 kV.

  • - (S)TEM resolution: <1.4 Å.

  • - High throughput for structure and chemical analysis.

Scios FIB SEM (Dual Beam) microscope for high resolution 3D characterization at nanometer scale for high quality sample preparation and 3D characterization.

Spectra (S)TEM

Uncover atomic structure

  • - Ready access to sub-Angstrom information.

  • - High tension: 30-300 kV

  • - (S)TEM resolution: <0.5 Å.

  • - High throughput for atomic-resolution work.

Scios FIB SEM (Dual Beam) microscope for high resolution 3D characterization at nanometer scale for high quality sample preparation and 3D characterization.

Iliad (S)TEM

See beyond the atomic horizon

  • - Seamless EELS and EDS spectroscopy with an EELS filter/spectrometer and the Ultra-X EDS Detector.

  • - The fast NanoPulser beam blanker for electron dose optimization and time-resolved experiments.

  • - Switch between accelerating voltage settings from 30 to 300 kV in only a few minutes.

  • - High tension 30-300 kV. (S)TEM resolution: <0.5 Å.

  • - High throughput for atomic-scale chemical analysis. 

TEM instruments for Life Science

Cryo EM sample preparation using the Aquilos 2 Cryo FIB - Extend cryo EM sample prep run time with enhanced automation for cryo electron tomography and microED.

Talos 12

Designed for multi-user facilities performing life science, biomedical, and pathology research, or pharmaceutical drug formulation analysis.

  • - Tissue section imaging for pathologists, cell biologists, neurobiologists, and plant researchers.

  • - Can be equipped with cryo-EM capabilities for native-state imaging, as well as protein and crystal structure analysis.

  • - High-throughput cryo-EM acquisition and analysis of lipid nanoparticles (LNPs) for drug delivery systems.

Scios FIB SEM (Dual Beam) microscope for high resolution 3D characterization at nanometer scale for high quality sample preparation and 3D characterization.

Talos F200C

Ideal for mixed life sciences and materials science research facilities, or pharmaceutical drug formulation analysis.

  • - Tissue section imaging for pathologists, cell biologists, neurobiologists, and plant researchers.

  • - High-contrast, high-quality TEM and STEM with up to four channel-integrated STEM detectors for in-depth materials analysis.

  • - Higher resolution and higher throughput for cryo-EM applications.

Scios FIB SEM (Dual Beam) microscope for high resolution 3D characterization at nanometer scale for high quality sample preparation and 3D characterization.

Cryo-TEM family

Instruments specialized for cryo-EM applications in the life sciences and pharmaceutical research, from single particle analysis to cryo-electron tomography.

  • - High-resolution instruments for the analysis of proteins, macromolecular complexes, and viruses.

  • - High-throughput for drug characterization and screening.

  • - Advanced cryo-electron tomography for 3D images of cellular structures in their near-native, frozen-hydrated state.

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128/190 Phyathai Plaza Building, 17th Floor Phyathai Road, Thung – Phyathai, Radthavee, Bangkok 10400

Tel : 66(0) 2 612 9091,66(0) 2 612 9092
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LMS Instruments Co., Ltd. (Distributor & Supplier of Testing Instruments in Thailand)
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